Author:
Jeng-Horng T.,Ming-Jun Hsiao ,Tsin-Yuan Chang
Cited by
3 articles.
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1. Detection of Catastrophic Faults in 6-Bit R-2R Ladder DAC;2023 8th International Conference on Electrical, Electronics and Information Engineering (ICEEIE);2023-09-28
2. New OBIST Using On-Chip Compensation of Process Variations Toward Increasing Fault Detectability in Analog ICs;IEEE Transactions on Nanotechnology;2013-07
3. Built-in high resolution signal generator for testing ADC and DAC;2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672)