NHPP Testability Growth Model Considering Testability Growth Effort, Rectifying Delay, and Imperfect Correction-Reference-Cited by-同舟云学术

NHPP Testability Growth Model Considering Testability Growth Effort, Rectifying Delay, and Imperfect Correction

Author:

Li Tianmei^ORCID,Si Xiaosheng^ORCID,Yang Zonghao^ORCID,Pei Hong^ORCID,Ma Yuzhe^ORCID

Funder

National Key R&D Program of China

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science

Link

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