A Compact High-Resolution Resonance-Based Capacitive Sensor for Defects Detection on PCBAs-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A Compact High-Resolution Resonance-Based Capacitive Sensor for Defects Detection on PCBAs

Published:2020 Issue: Volume:8 Page:203758-203768
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Qiu Tie^ORCID,Tek Choon Kait Andrew^ORCID,Huang Shao Ying^ORCID

Funder

Keysight Technologies - SUTD collaboration

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science

Link

http://xplorestaging.ieee.org/ielx7/6287639/8948470/09252956.pdf?arnumber=9252956

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Detection and Classification of Defects on Printed Circuit Board Assembly through Deep Learning;2024 9th International Conference on Smart and Sustainable Technologies (SpliTech);2024-06-25

2. The Core Industry Manufacturing Process of Electronics Assembly Based on Smart Manufacturing;ACM Transactions on Management Information Systems;2022-12-31

3. Method of PCB defect detection with yolov5 algorithm by adding transformer module;2022 5th International Conference on Computer Science and Software Engineering (CSSE 2022);2022-10-21

4. Telemetric QCM-D based sensing system with adaptive excitation frequency;2022 IEEE Sensors Applications Symposium (SAS);2022-08-01

5. Printed Circuit Boards Defect Detection Method Based on Improved Fully Convolutional Networks;IEEE Access;2022

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP