Deep Learning and Computer Vision Techniques for Enhanced Quality Control in Manufacturing Processes-Reference-Cited by-同舟云学术

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Deep Learning and Computer Vision Techniques for Enhanced Quality Control in Manufacturing Processes

Published:2024 Issue: Volume:12 Page:121449-121479
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Raisul Islam Md¹,Zakir Hossain Zamil Md²,Eshmam Rayed Md³^ORCID,Mohsin Kabir Md⁴^ORCID,Mridha M. F.³^ORCID,Nishimura Satoshi⁵^ORCID,Shin Jungpil⁵^ORCID

Affiliation:

1. School of Engineering and Technology, Western Illinois University, Macomb, IL, USA

2. School of Computer Sciences, Western Illinois University, Macomb, IL, USA

3. Department of Computer Science and Engineering, American International University-Bangladesh, Dhaka, Bangladesh

4. Faculty of Informatics, Eötvös Loránd University, Budapest, Hungary

5. School of Computer Science and Engineering, The University of Aizu, Aizuwakamatsu, Japan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/6287639/10380310/10663422.pdf?arnumber=10663422

Reference134 articles.

1. A Review and Analysis of Automatic Optical Inspection and Quality Monitoring Methods in Electronics Industry

2. A Review on Defect Detection of Electroluminescence-Based Photovoltaic Cell Surface Images Using Computer Vision

3. Recent advances in surface defect inspection of industrial products using deep learning techniques

4. Computer Vision Techniques in Manufacturing

5. A survey on deep learning and its applications

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