A Bilevel Multi-Fidelity Polynomial Chaos Approach for the Uncertainty Quantification of MWCNT Interconnect Networks With Variable Imperfect Contact Resistances
Author:
Affiliation:
1. Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand, India
2. Department of Electrical Engineering, Indian Institute of Technology Rupnagar, Rupnagar, Punjab, India
Funder
Ministry of Electronics and Information Technology (IT), Government of India, under the Visvesvaraya Ph.D. Scheme
Faculty Initiation Grant of the Indian Institute of Technology Roorkee
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/6287639/9668973/09917520.pdf?arnumber=9917520
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Conservative Gaussian Process Models for Uncertainty Quantification and Bayesian Optimization in Signal Integrity Applications;IEEE Transactions on Components, Packaging and Manufacturing Technology;2024-07
2. Artificial Neural Networks With Fast Transfer Learning for Statistical Signal Integrity Analysis of MWCNT and MLGNR Interconnect Networks;IEEE Transactions on Electromagnetic Compatibility;2024-06
3. Modified Knowledge-Based Neural Networks Using Control Variates for the Fast Uncertainty Quantification of On-Chip MWCNT Interconnects;IEEE Transactions on Electromagnetic Compatibility;2023-08
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