Ok-NB: An Enhanced OPTICS and k-Naive Bayes Classifier for Imbalance Classification With Overlapping
Author:
Affiliation:
1. Department of Information Technology, North-Eastern Hill University, Shillong, India
2. Department of Computer and Information Sciences, Northumbria University, Newcastle upon Tyne, NE1 8ST, U.K.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Link
http://xplorestaging.ieee.org/ielx7/6287639/10380310/10506448.pdf?arnumber=10506448
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