Near-Field Diffuse Scattering Measurement Technique for Use With Effective Roughness Model
Author:
Affiliation:
1. School of Mechanical Engineering, Gwangju Institute of Science and Technology, Gwangju, South Korea
2. School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, Gwangju, South Korea
Funder
Ministry of Oceans and Fisheries, South Korea
Ministry of Science and ICT, South Korea
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/6287639/10005208/10224232.pdf?arnumber=10224232
Reference31 articles.
1. Fast numerical method for electromagnetic scattering by rough layered interfaces: Propagation-inside-layer expansion method
2. An approach to include stochastic rough surface scattering into deterministic ray-optical wave propagation modeling
3. A diffuse scattering model for urban propagation prediction
4. Electromagnetic Wave Scattering from Random Rough Surfaces: Basics
5. Effect Level Based Parameterization Method for Diffuse Scattering Models at Millimeter-Wave Frequencies
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