Few-Shot PCB Surface Defect Detection Based on Feature Enhancement and Multi-Scale Fusion
Author:
Affiliation:
1. College of Electrical and Power Engineering, Taiyuan University of Technology, Taiyuan, China
2. College of Information and Computer, Taiyuan University of Technology, Jinzhong, China
Funder
Research Project Supported by Shanxi Scholarship Council of China
Natural Science Foundation of Shanxi Province
Shanxi Science and Technology Cooperation and Exchange Project
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/6287639/9668973/09979794.pdf?arnumber=9979794
Reference46 articles.
1. Meta-Learning to Detect Rare Objects
2. Few-Shot Object Detection and Viewpoint Estimation for Objects in the Wild
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4. LSTD: A Low-Shot Transfer Detector for Object Detection
5. Graph-based few-shot learning with transformed feature propagation and optimal class allocation
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