Testing Randomness Using Artificial Neural Network-Reference-Cited by-同舟云学术

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Testing Randomness Using Artificial Neural Network

Published:2020 Issue: Volume:8 Page:163685-163693
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Feng Yulong,Hao Lingyi^ORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science

Link

http://xplorestaging.ieee.org/ielx7/6287639/8948470/09187201.pdf?arnumber=9187201

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3. Security Analysis of the Symmetric Cryptosystem TinyJambu;Symmetry;2024-04-05

4. Quantum random number generation using an on-chip nanowire plasmonic waveguide;New Journal of Physics;2024-04-01

5. Monitoring Hardware True Random Number Generators with Artificial Neural Networks: Problem Modeling and Training Dataset Generation;Lecture Notes in Electrical Engineering;2024

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