Eliminating the Resonance Interference for an Inductive Speed Sensor Subjected to an Early-Time HEMP Field
Author:
Affiliation:
1. Army Engineering University of PLA, Nanjing, China
2. Nanjing University of Aeronautics and Astronautics, Nanjing, China
3. Nanjing University of Information Sciences and Technology, Nanjing, China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/6287639/9668973/09857895.pdf?arnumber=9857895
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4. Predicting the Breakdown Behaviorof Microcontrollers Under EMP/UWB Impact Using a Statistical Analysis
5. Research on Electromagnetic Susceptibility of Electronic Modules in Component-Level HEMP PCI Test
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