Funder
President Office of Chang Gung University by providing financial support to the CReST Laboratory
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
General Engineering,General Materials Science,General Computer Science
Cited by
17 articles.
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1. Degradation Physics of Silicone Under UV-A Irradiation;IEEE Transactions on Device and Materials Reliability;2023-12
2. Degradation Analysis of Silicone as Encapsulation and Molding Material in High Power LEDs;Light-Emitting Diodes - New Perspectives;2023-02-22
3. General failure analysis techniques for packaged LED;Reliability and Failure Analysis of High-Power LED Packaging;2023
4. Introduction;Reliability and Failure Analysis of High-Power LED Packaging;2023
5. Moisture Dependent Degradation Rate of Silicone in LED Optical Housing Material—Ab-Initio Modelling;IEEE Transactions on Device and Materials Reliability;2022-12