GAN Neural Networks Architectures for Testing Process Control Industrial Network Against Cyber-Attacks-Reference-Cited by-同舟云学术

GAN Neural Networks Architectures for Testing Process Control Industrial Network Against Cyber-Attacks

Published:2023 Issue: Volume:11 Page:49587-49600
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Zarzycki Krzysztof¹^ORCID,Chaber Patryk¹,Cabaj Krzysztof²^ORCID,Ławryńczuk Maciej¹^ORCID,Marusak Piotr¹^ORCID,Nebeluk Robert¹,Plamowski Sebastian¹,Wojtulewicz Andrzej¹

Affiliation:

1. Faculty of Electronics and Information Technology, Institute of Control and Computation Engineering, Warsaw University of Technology, Warsaw, Poland

2. Faculty of Electronics and Information Technology, Institute of Computer Science, Warsaw University of Technology, Warsaw, Poland

Funder

National Centre for Research and Development

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/6287639/10005208/10128113.pdf?arnumber=10128113

Reference41 articles.

1. A Standalone Gray-Box EtherCAT Fuzzer

2. Automatic Steganographic Distortion Learning Using a Generative Adversarial Network

3. A Modbus/TCP Fuzzer for testing internetworked industrial systems

4. GENPass: A Multi-Source Deep Learning Model for Password Guessing

5. MTF -Storm: a High Performance Fuzzer for Modbus/TCP

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