Utilizing YOLO Models for Real-World Scenarios: Assessing Novel Mixed Defect Detection Dataset in PCBs-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Utilizing YOLO Models for Real-World Scenarios: Assessing Novel Mixed Defect Detection Dataset in PCBs

Published:2024 Issue: Volume:12 Page:100983-100990
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Kumar Ancha Vinod¹^ORCID,Sibai Fadi N.²^ORCID,Gonuguntla Venkateswarlu³^ORCID,Vaddi Ramesh¹^ORCID

Affiliation:

1. Department of Electronics and Communication Engineering, SRM University AP, Amaravati, Andhra Pradesh, India

2. GUST Engineering and Applied Innovation Research Center (GEAR), Gulf University for Science and Technology, Mishref, Kuwait

3. Symbiosis Centre for Medical Image Analysis, Symbiosis International (Deemed University), Pune, India

Funder

Symbiosis Centre for Medical Image Analysis, Symbiosis International

Gulf University for Science and Technology (GUST) Engineering and Applied Innovation Research Center (GEAR), GUST, Mishref, Kuwait

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/6287639/10380310/10601640.pdf?arnumber=10601640

Reference27 articles.

1. Research on PCB surface assembly defect detection method based on machine vision;Deng,2019

2. Research progress and prospect of machine vision technology;Yun;J. Graph.,2020

3. An algorithm to group defects on printed circuit board for automated visual inspection;Khalid;Int. J. Simul. Syst. Sci.,2008

4. Printed Circuit Board Defect Detection Methods Based on Image Processing, Machine Learning and Deep Learning: A Survey

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP