Universal Kriging Prediction of Line-of-Sight Microwave Fading-Reference-Cited by-同舟云学术

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Universal Kriging Prediction of Line-of-Sight Microwave Fading

Published:2020 Issue: Volume:8 Page:74743-74758
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Salamon Stephen J.^ORCID,Hansen Hedley J.^ORCID,Abbott Derek^ORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science

Link

http://xplorestaging.ieee.org/ielx7/6287639/8948470/09064774.pdf?arnumber=9064774

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. C-VoNNI: a precise fingerprint construction for indoor positioning systems using natural neighbor methods with clustering-based Voronoi diagrams;The Journal of Supercomputing;2023-12-29

2. Geo-spatial distribution of radio refractivity and the influence of fade depth on microwave propagation signals over Nigeria;International Journal of Physical Sciences;2023-07-31

3. On Deploying Secondary Networks in Co-Channel Bands with DTV Networks;IEEE Transactions on Vehicular Technology;2022-07

4. A novel adaptive Kriging method: Time-dependent reliability-based robust design optimization and case study;Computers & Industrial Engineering;2021-12

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