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Intelligent Identification Method of Insulator Defects Based on CenterMask

  • Published:2022 Issue: Volume:10 Page:59772-59781
  • ISSN:2169-3536
  • Container-title:IEEE Access
  • language:
  • Short-container-title:IEEE Access

Author:

Xuan Zhiming1ORCID,Ding Jiwei1,Mao Jing1

Affiliation:

1. CEEC Jiangsu Electric Power Design Institute Company Ltd., Nanjing, China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An Instance Segmentation Method for Insulator Defects Based on an Attention Mechanism and Feature Fusion Network;Applied Sciences;2024-04-25

2. Guardians of Grids: A Novel Method for Identifying High-Voltage Insulator Flaws;2024 Second International Conference on Emerging Trends in Information Technology and Engineering (ICETITE);2024-02-22

3. MFI-YOLO: Multi-Fault Insulator Detection Based on an Improved YOLOv8;IEEE Transactions on Power Delivery;2024-02

4. Electrical insulator defect detection with incomplete annotations and imbalanced samples;IET Generation, Transmission & Distribution;2024-01-18

5. Improved Convolutional Neural Network for Traffic Scene Segmentation;Computer Modeling in Engineering & Sciences;2024
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