Noise-Robust Online Measurement of the On-State Resistance of the Power Semiconductor Devices in PWM Converters-Reference-Cited by-同舟云学术

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Noise-Robust Online Measurement of the On-State Resistance of the Power Semiconductor Devices in PWM Converters

Published:2024 Issue: Volume:12 Page:63669-63682
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Shin Junho¹^ORCID,Shin Jong-Won²^ORCID,Kim Wonhee³^ORCID

Affiliation:

1. Department of Smart Cities, Chung-Ang University, Seoul, South Korea

2. Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea

3. School of Energy Systems Engineering, Chung-Ang University, Seoul, South Korea

Funder

Research and Development Program of Korea Institute of Energy Research

National Research Foundation of Korea

Ministry of Science and Information and Communication Technology

Chung-Ang University Graduate Research Scholarship in 2022

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/6287639/10380310/10518033.pdf?arnumber=10518033

Reference37 articles.

1. An Industry-Based Survey of Reliability in Power Electronic Converters

2. Power electronic converter reliability and prognosis review focusing on power switch module failures

3. Lifetime-based fault tolerant strategy for three-level hybrid ANPC inverters

4. Modeling aging effects of IGBTs in power drives by ringing characterization

5. A New Fault Detection Technique for IGBT Based on Gate Voltage Monitoring

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