Research on ELM Soft Fault Diagnosis of Analog Circuit Based on KSLPP Feature Extraction-Reference-Cited by-同舟云学术

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Research on ELM Soft Fault Diagnosis of Analog Circuit Based on KSLPP Feature Extraction

Published:2019 Issue: Volume:7 Page:92517-92527
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Xu-Sheng Gan^ORCID,Hong Qu,Xiang-Wei Meng,Chun-Lan Wang,Jie Zhu

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science

Link

http://xplorestaging.ieee.org/ielx7/6287639/8600701/08736964.pdf?arnumber=8736964

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Fault Diagnosis Method for Analog Circuits Based on Improved TQWT and Inception Model;Symmetry;2024-06-10

2. Residual current detection method based on improved VMD-BPNN;PLOS ONE;2024-02-08

3. A Fault Diagnosis Strategy for Analog Circuits with Limited Samples Based on the Combination of the Transformer and Generative Models;Sensors;2023-11-11

4. Soft Fault Diagnosis in Embedded Switched-Capacitor Filters;Circuits, Systems, and Signal Processing;2023-01-20

5. Research on WPD and DBSCAN-L-ISOMAP for circuit fault feature extraction;Open Physics;2023-01-01

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