Author:
Barcellona Concetta,Bucolo Maide,Stella Giovanna,Buscarino Arturo,Fortuna Luigi,Mazzitelli Giuseppe,Esposito Basilio
Cited by
1 articles.
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1. Tokamaks images advanced processing for diagnostics;2022 IEEE 31st International Symposium on Industrial Electronics (ISIE);2022-06-01