Sulphur hexafluoride: introduction to the material and dielectric
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx1/57/1487/00035605.pdf?arnumber=35605
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3. Ab initio molecular dynamics calculations on electron ionization induced fragmentations of C4F7N and C5F10O for understanding their decompositions under discharge conditions;Physical Chemistry Chemical Physics;2023
4. Arc decomposition behavior of C 4 F 7 N/Air gas mixture and biosafety evaluation of its by‐products;High Voltage;2022-07-04
5. Pulsed Townsend measurement of electron swarm parameters in C4F7N–CO2 and C4F7N–N2 mixtures as eco-friendly insulation gas;Journal of Applied Physics;2022-01-21
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