Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Cited by
3 articles.
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1. On the Reliability Estimation of Analog CMOS Circuits Based on Statistical Methods;2019 11th International Conference on Electrical and Electronics Engineering (ELECO);2019-11
2. A New SPICE Reliability Simulation Method for Deep Submicrometer CMOS VLSI Circuits;IEEE Transactions on Device and Materials Reliability;2006-06
3. Design for reliability;Microelectronics Reliability;2000-08