Anomaly Detection Technology for Cloud Manufacturing System based on Data Denoising and Feature Optimization
Author:
Affiliation:
1. School of Automation Science and Electrical Engineering, Beihang University,Beijing,China,100191
2. Beijing Institute of Computer Technology and Application,Department of Intelligent Manufacturing,Beijing,China,100854
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10004025/10004026/10004139.pdf?arnumber=10004139
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