An Investigation Methodology to Predict Far Field Radiated Immunity from Near Field Scan Immunity Measurements
Author:
Affiliation:
1. Qualification Laboratories EMC, Continental Automotive France,Toulouse,France
2. INSA Toulouse,Computer and Electrical Engineering LAAS-CNRS,Toulouse,France
3. Packaging, Assembly and EMC IMS Bordeaux,Bordeaux,France
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9900492/9900921/09900974.pdf?arnumber=9900974
Reference10 articles.
1. Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method;IEC 62132–4,2006
2. ICs electromagnetic susceptibility: comparison between near field injection method and a direct injection method;castagnet;Proc 3rd International Conference on Near Field Imaging and Characterization- ICONIC,2007
3. Study of the coupling of wide band Near Field Scan probe dedicated to the investigation of the radiated immunity of Printed Circuit Boards
4. Near field-Immunity Scan on Printed Circuit Board Level;kroning;Proc IEEE 14th Workshop on Signal Propagation on Interconnects - SPI,2010
5. Integrated circuits - Measurement of electromagnetic immunity - Part;Part 2 Measurement of Radiated Immunity TEM Cell and Wideband TEM Cell Method IEC,2010
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