A Comparative Study of DPI levels on BMS IC With an On-Hand Analytical Model to Predict Resonances-Reference-Cited by-同舟云学术

A Comparative Study of DPI levels on BMS IC With an On-Hand Analytical Model to Predict Resonances

Published:2022-09-05 Issue: Volume: Page:
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Container-title:2022 International Symposium on Electromagnetic Compatibility – EMC Europe
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Author:

Guendouz Badr¹,Abouda Kamel²,Boyer Alexandre³,Dhia Sonia Ben³,Mediouni Hiba²,Dietsch Jerome¹

Affiliation:

1. NXP Semiconductors, INSA, LAAS,Toulouse,France

2. NXP Semiconductors,Toulouse,France

3. Univ. de Toulouse, INSA, UPS, LAAS,Toulouse,France

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9900492/9900921/09901210.pdf?arnumber=9901210

Reference8 articles.

1. A New Approach for Closed-Form Transient Analysis of Multiconductor Transmission Lines

2. Influence of a Traction Battery's Input Impedance on Conducted Emissions of an Automotive HV Inverter;reuter;International Symposium on Electromagnetic Compatibility (EMC Europe 2013),2013

3. IEC 62132–4 - edition 1.0;Measurement of Electromagnetic Immunity-Part 4 Direct RF Power Injection Method,2006

4. A new fast method for ladder networks characterization

5. Enhanced hotplug protection in BMS applications. Part II: Enhanced Solution Development

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