Performance Charaterisation of the Decoupling Capacitor Network using the Near-Field Measurement-Reference-Cited by-同舟云学术

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Performance Charaterisation of the Decoupling Capacitor Network using the Near-Field Measurement

Published:2023-09-04 Issue: Volume: Page:
ISSN:
Container-title:2023 International Symposium on Electromagnetic Compatibility – EMC Europe
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Author:

Serpaud Sébastien¹,Coccetti Fabio¹,Boyer Alexandre²,Dhia Sonia Ben²

Affiliation:

1. IRT Saint-Exupéry Institute,Toulouse,France

2. LAAS-CNRS Univ. de Toulouse, INSA, UPS, LAAS,Toulouse,France

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10274151/10274152/10274359.pdf?arnumber=10274359

Reference7 articles.

1. Power-supply network modeling;levant;3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits,2002

2. Application de la méthode de mesure champ proche en émission pour l’aide à la conception et à l’investigation des non-conformités CEM des cartes électroniques;serpaud;Ph D Dissertation,2023

3. Impedance and EMC characterization of embedded capacitance materials;novak;APEX2001 Conf Dig,2001

4. ICEM modelling of microcontroller current activity

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