An Improved Reference Device for Radiated Immunity Interlaboratory Comparison-Reference-Cited by-同舟云学术

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An Improved Reference Device for Radiated Immunity Interlaboratory Comparison

Published:2020-09-23 Issue: Volume: Page:
ISSN:
Container-title:2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
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Author:

Tas Emrah,Pythoud Frederic,Muhlemann Beat

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9245449/9245605/09245638.pdf?arnumber=9245638

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Reference Measurement for Inter-Laboratory Comparison of Electric Field Uniformity for Radiated Immunity Testing;2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa);2024-05-20

2. Lessons from Proficiency Testing in EMC;2023 International Symposium on Electromagnetic Compatibility – EMC Europe;2023-09-04

3. An Interlaboratory Comparison on Radiated Immunity IEC 61000-4-3;2022 International Symposium on Electromagnetic Compatibility – EMC Europe;2022-09-05

4. Quantitative Interlaboratory Comparison of Radiated Immunity Test for On-board Equipment;2021 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC);2021-09-27

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