Measurement Technique for Interface and Surface Conductivities at Millimeter-Wave Frequencies Using Dielectric Rod Resonator Excited by Nonradiative Dielectric Waveguide-Reference-Cited by-同舟云学术

Measurement Technique for Interface and Surface Conductivities at Millimeter-Wave Frequencies Using Dielectric Rod Resonator Excited by Nonradiative Dielectric Waveguide

Published:2022-05 Issue:5 Volume:70 Page:2750-2761
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Hirayama Naoki¹^ORCID,Nakayama Akira¹^ORCID,Yoshikawa Hiromichi¹^ORCID,Shimizu Takashi²^ORCID,Kogami Yoshinori²

Affiliation:

1. Research and Development Group, Kyocera Corporation, Kirishima, Kagoshima, Japan

2. Graduate School of Engineering, Utsunomiya University, Utsunomiya, Tochigi, Japan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/22/9769854/09737687.pdf?arnumber=9737687

Reference29 articles.

1. Millimeter-wave measurement of complex permittivity using dielectric rod resonator excited by NRD-guide

2. Measurements of interface conductivity of copper-clad dielectric substrates at millimeter wave frequencies using ${\mathrm {TE}}_{02\delta}$ mode dielectric rod resonator excited by NRD guide;hirayama;Proc Asia–Pacific Microw Conf (APMC),2018

3. Single-crystal dielectric resonators for low-temperature electronics applications

4. Microwave Measurement of Dielectric Properties of Low-Loss Materials by the Dielectric Rod Resonator Method

5. Round Robin test on a dielectric resonator method for measuring complex permittivity at microwave frequency;kobayashi;IEICE Trans Electron,1994

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