A Novel Machine-Learning-Based Batch Selection Method in Sparse Near-Field Scanning-Reference-Cited by-同舟云学术

A Novel Machine-Learning-Based Batch Selection Method in Sparse Near-Field Scanning

Published:2022-11 Issue:11 Volume:70 Page:5019-5028
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Zhang Ling¹^ORCID,Feng Yu-Ru¹^ORCID,Pu Bo²^ORCID,Cai Xiao-Ding³^ORCID,Li Da¹^ORCID,Wei Xing-Chang¹^ORCID,Mutnury Bhyrav⁴,Fan Jun⁵^ORCID,Chen Hongsheng¹^ORCID,Drewniak James L.⁵^ORCID,Li Er-Ping¹^ORCID

Affiliation:

1. College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China

2. DetoolIC Technology, Ningbo, China

3. Cisco, San Jose, CA, USA

4. Enterprise Product Group, Dell, Round Rock, TX, USA

5. Electromagnetic Compatibility Laboratory, Missouri University of Science and Technology, Rolla, MO, USA

Funder

Zhejiang Provincial Natural Science Foundation of China

Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/22/9939118/09903368.pdf?arnumber=9903368

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