Phase Noise Reduction in LC VCO’s Using an Array of Cross-Coupled Nanoscale MOSFETs and Intelligent Post-Fabrication Selection-Reference-Cited by-同舟云学术

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Phase Noise Reduction in LC VCO’s Using an Array of Cross-Coupled Nanoscale MOSFETs and Intelligent Post-Fabrication Selection

Published:2022-06 Issue:6 Volume:70 Page:3244-3256
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Yelleswarapu Pavan¹^ORCID,Jha Amit²^ORCID,Willis Richard³,Makris Yiorgos⁴^ORCID,O Kenneth K.⁴^ORCID

Affiliation:

1. Qualcomm Technologies Inc., Richardson, TX, USA

2. Qualcomm Technologies Inc., San Jose, CA, USA

3. Citigroup Global Markets Inc., New York, NY, USA

4. Electrical and Computer Engineering Department, The University of Texas at Dallas, Richardson, TX, USA

Funder

Semiconductor Research Corporation (SRC) through the Texas Analog Center of Excellence, The University of Texas at Dallas

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/22/9788475/09760180.pdf?arnumber=9760180

Reference58 articles.

1. Modeling of the 1/f noise overshoot in short-channel MOSFETs locally degraded by hot-carrier injection

2. A unified model for the flicker noise in metal-oxide-semiconductor field-effect transistors

3. 1/f noise and related surface effects in germanium;mcworther,1955

4. An 8-bit 1.5 GS/s flash ADC using post-manufacturing statistical selection;proesel;Proc IEEE Custom Integr Circuits Conf (CICC),2010

5. Digital calibration incorporating redundancy of flash adcs

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 19-GHz VCO with Phase Noise of -117 dBc/Hz at 1-MHz Offset Using an Array of Near Minimum Size Transistors and Intelligent Post Fabrication Selection;2024 IEEE/MTT-S International Microwave Symposium - IMS 2024;2024-06-16

2. Component-Related Phase Noise Evaluation Method for the LC Oscillators;Circuits, Systems, and Signal Processing;2023-08-09

3. Layout of MOS Varactor with Improved Quality Factor for Cross-Coupled Differential Voltage-Controlled Oscillator Applications;Electronics;2023-03-14

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