An Overview of Clutter Mitigation Methods for Tomographic Material Inspection-Reference-Cited by-同舟云学术

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An Overview of Clutter Mitigation Methods for Tomographic Material Inspection

Published:2021-01 Issue:1 Volume:69 Page:846-860
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Meier Dominik¹^ORCID,Gashi Bersant¹^ORCID,Zech Christian¹^ORCID,Baumann Benjamin¹,Link Torsten²,Schlechtweg Michael¹,Kuhn Jutta¹^ORCID,Rosch Markus¹^ORCID,Reindl Leonhard M.³^ORCID

Affiliation:

1. Fraunhofer Institute for Applied Semiconductor Physics IAF, Freiburg im Breisgau, Germany

2. Composite Material Supply GmbH (Enercon Group), Aurich, Germany

3. Department of Microsystems Engineering, University of Freiburg IMTEK (Technische Fakultat), Freiburg im Breisgau, Germany

Funder

German Federal Ministry of Economic Affairs and Energy (BMWi) in the frame of the InFaRo Project

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/22/9314312/09257385.pdf?arnumber=9257385

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