Nanoscale Surface Roughness Effects on THz Vacuum Electron Device Performance-Reference-Cited by-同舟云学术

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Nanoscale Surface Roughness Effects on THz Vacuum Electron Device Performance

Published:2016-01 Issue:1 Volume:15 Page:85-93
ISSN:1536-125X
Container-title:IEEE Transactions on Nanotechnology
language:
Short-container-title:IEEE Trans. Nanotechnology

Author:

Gamzina Diana,Li Hanyan,Himes Logan,Barchfeld Robert,Popovic Branko,Pan Pan,Letizia Rosa,Mineo Mauro,Feng Jinjun,Paoloni Claudio,Luhmann Neville C.

Funder

U.K. EPSRC

DARPA

NSF MRI

DOE NSTX

DOD

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications

Link

http://xplorestaging.ieee.org/ielx7/7729/7373702/07337419.pdf?arnumber=7337419

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