Reset Variability in Phase Change Memory for Hardware Security Applications-Reference-Cited by-同舟云学术

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Reset Variability in Phase Change Memory for Hardware Security Applications

Published:2021 Issue: Volume:20 Page:75-82
ISSN:1536-125X
Container-title:IEEE Transactions on Nanotechnology
language:
Short-container-title:IEEE Trans. Nanotechnology

Author:

Noor Nafisa^ORCID,Muneer Sadid^ORCID,Khan Raihan Sayeed^ORCID,Gorbenko Anna^ORCID,Adnane L'Hacene,Kashem Md Tashfiq Bin,Scoggin Jake,Dirisaglik Faruk^ORCID,Cywar Adam,Gokirmak Ali,Silva Helena^ORCID

Funder

Multi-University Research Initiative

Air Force Office of Scientific Research

National Science Foundation

Research Experience for Undergraduate

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications

Link

https://ieeexplore.ieee.org/ielam/7729/9310738/9273232-aam.pdf

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Era of Sentinel Tech: Charting Hardware Security Landscapes Through Post-Silicon Innovation, Threat Mitigation and Future Trajectories;IEEE Access;2024

2. ANV-PUF: Machine-Learning-Resilient NVM-Based Arbiter PUF;ACM Transactions on Embedded Computing Systems;2023-09-09

3. Atomic Layer Deposition of GeSb₂Te₄ Thin Films for Reliable Phase Change Memory With a High Dynamic Range;IEEE Electron Device Letters;2023-09

4. Design for Ultrahigh-Density Vertical Phase Change Memory: Proposal and Numerical Investigation;Electronics;2022-06-08

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