Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Science Applications
Cited by
29 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness;IEEE Transactions on Emerging Topics in Computing;2018-10-01
2. Gate-Level Circuit Reliability Analysis: A Survey;VLSI Design;2014-07-10
3. Reliable circuit analysis and design using nanoscale devices;SPIE Proceedings;2013-01-28
4. Introduction;Design, Analysis and Test of Logic Circuits Under Uncertainty;2012-09-22
5. Reliability of Nanoelectronic VLSI;Advanced Circuits for Emerging Technologies;2012-05-07