Unified View of Damage leaves Planimetry & Analysis Using Digital Images Processing Techniques-Reference-Cited by-同舟云学术

Unified View of Damage leaves Planimetry & Analysis Using Digital Images Processing Techniques

Published:2023-04-28 Issue: Volume: Page:
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Container-title:2023 International Conference on Computational Intelligence and Sustainable Engineering Solutions (CISES)
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Author:

Kumar Pijush Kanti¹,Munjal DeepKiran²,Rani Sunita³,Dutta Anurag¹,Voumik Liton Chandra⁴,Ramamoorthy A.⁵

Affiliation:

1. Government College of Engineering & Textile Technology,Department of Information Technology,Serampore, Calcutta,India

2. G. L. Bajaj Institute of Technology and Management,Department of Computer Applications,Greater Noida,Uttar Pradesh,India

3. Noida Institute of Engineering and Technology,Department of Engineering Administration,Greater Noida,Uttar Pradesh,India

4. Noakhali Science and Technology University,Department of Economics,Noakhali,Bangladesh

5. Velammal Engineering College, Anna University,Department of Mathematics,Chennai,Tamil Nadu,India

Publisher

IEEE

Link

Reference21 articles.

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