A Method for Measuring the Refractive Index Profile of Thin-Film Waveguide (Letters)-Reference-Cited by-同舟云学术

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A Method for Measuring the Refractive Index Profile of Thin-Film Waveguide (Letters)

Published:1975-01 Issue:1 Volume:23 Page:176-177
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:en
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Mittra R.,Itoh T.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx6/22/25012/01128519.pdf?arnumber=1128519

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Terahertz Pioneer: Tatsuo Itoh “Transmission Lines and Antennas: Left and Right”;IEEE Transactions on Terahertz Science and Technology;2014-05

2. Mode spectroscopy of double-layer magnetic garnet films;IEEE Transactions on Magnetics;1984-09

3. Index profiles of planar optical waveguides determined from the angular dependence of reflectivity;IEEE Journal of Quantum Electronics;1978-07

4. Determination of optical constants of polymeric thin films by integrated optical techniques;Optics Communications;1976-08

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