Comparison of Methods for Sensitivity Determination of Point-Contact Diodes at Submillimeter Wavelength-Reference-Cited by-同舟云学术

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Comparison of Methods for Sensitivity Determination of Point-Contact Diodes at Submillimeter Wavelength

Published:1977-06 Issue:6 Volume:25 Page:468-470
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:en
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Sauter E.,Schultz G.V.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx6/22/25041/01129135.pdf?arnumber=1129135

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Improvement of a point-contact detector performance using the terajet effect initiated by photonics;Optical Engineering;2020-10-22

2. Heterodyne spectroscopy for submillimeter and far-infrared wavelengths from 100 μm to 500 μm;Infrared Physics;1991-01

3. The coupling of submillimeter corner-cube antennas to Gaussian beams;Infrared Physics;1989-07

4. Stark spectroscopy using tunable far-infrared radiation;Journal of the Optical Society of America B;1987-07-01

5. Laboratory measurement of the pure rotational spectrum of vibrationally excited HCO(+) (nu2 = 1) by far-infrared laser sideband spectroscopy;The Astrophysical Journal;1987-05

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