A tanh substitution technique for the analysis of abrupt and graded interface multilayer dielectric stacks-Reference-Cited by-同舟云学术

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A tanh substitution technique for the analysis of abrupt and graded interface multilayer dielectric stacks

Published:1991 Issue:9 Volume:27 Page:2086-2090
ISSN:0018-9197
Container-title:IEEE Journal of Quantum Electronics
language:
Short-container-title:IEEE J. Quantum Electron.

Author:

Corzine S.W.,Yan R.H.,Coldren L.A.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Link

http://xplorestaging.ieee.org/ielx1/3/3681/00135163.pdf?arnumber=135163

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