Author:
Heimann T.,van Ginneken B.,Styner M.A.,Arzhaeva Y.,Aurich V.,Bauer C.,Beck A.,Becker C.,Beichel R.,Bekes G.,Bello F.,Binnig G.,Bischof H.,Bornik A.,Cashman P.,Ying Chi ,Cordova A.,Dawant B.M.,Fidrich M.,Furst J.D.,Furukawa D.,Grenacher L.,Hornegger J.,Kainmuller D.,Kitney R.I.,Kobatake H.,Lamecker H.,Lange T.,Jeongjin Lee ,Lennon B.,Rui Li ,Senhu Li ,Meinzer H.-P.,Nemeth G.,Raicu D.S.,Rau A.-M.,van Rikxoort E.M.,Rousson M.,Rusko L.,Saddi K.A.,Schmidt G.,Seghers D.,Shimizu A.,Slagmolen P.,Sorantin E.,Soza G.,Susomboon R.,Waite J.M.,Wimmer A.,Wolf I.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Science Applications,Radiological and Ultrasound Technology,Software