Double Pulse Test Set-up: Hardware Design and Measurement Guidelines-Reference-Cited by-同舟云学术

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Double Pulse Test Set-up: Hardware Design and Measurement Guidelines

Published:2022-12-14 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE International Conference on Power Electronics, Drives and Energy Systems (PEDES)
language:
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Author:

Mondal Bishal¹,Pogulaguntla Ravi Teja¹,B Arun Karuppaswamy¹

Affiliation:

1. Indian Institute of Technology Madras,Department of Electrical Engineering,Chennai,India,600036

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10079845/10079940/10080339.pdf?arnumber=10080339

Reference10 articles.

1. Accurately Measuring High Speed GaN Transistors-Application Note: AN023;biswas;Efficient Power Conversion Corporation Tech Rep,2017

2. Design of Si-IGBT Gate Driver for Inverter Applications

3. Design and Performance Evaluation of a General Purpose Device Characterization Setup

4. Methodology for Wide Band-Gap Device Dynamic Characterization

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Stanowiska dydaktyczne w laboratorium energoelektroniki ISEP/ZEP PW – opracowanie i implementacja w procesie dydaktycznym;PRZEGLĄD ELEKTROTECHNICZNY;2024-05-14

2. Common Mistakes in Practical Power Supply Design with Wide Bandgap Devices;2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA);2023-12-04

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