Effect of Different Shapes on the Measurement of Dielectric Constants of Low-Loss Materials With Rectangular Waveguides at <i>X</i>-Band-Reference-Cited by-同舟云学术

Effect of Different Shapes on the Measurement of Dielectric Constants of Low-Loss Materials With Rectangular Waveguides at X-Band

Author:

Yang Guifeng¹,Zhou Shaohua²^ORCID,Liang Wei³,Li Xin⁴,Huang Hui⁵^ORCID,Yang Jianhua¹^ORCID

Affiliation:

1. School of Automation, Northwestern Polytechnical University, Xi’an, China

2. School of Microelectronics, Tianjin University, Tianjin, China

3. Beijing Institute of Metrology, Beijing, China

4. Beijing Guocekeyi Technology Company Ltd., Beijing, China

5. Beijing Xinchen Technology Company Ltd., Beijing, China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics

Link

Reference15 articles.

1. Transmission/reflection and short-circuit line methods for measuring permittivity and permeability;baker-jarvis,1992

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2. Experimental Study on Operating Frequency of Magneto-Dielectric Material Using SIW-Based Device;2024 IEEE International Black Sea Conference on Communications and Networking (BlackSeaCom);2024-06-24