Remaining Useful Life Prognosis of Power Semiconductor Devices Based on On-state Resistance Time Series Data and Deep Learning-Reference-Cited by-同舟云学术

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Remaining Useful Life Prognosis of Power Semiconductor Devices Based on On-state Resistance Time Series Data and Deep Learning

Published:2023-10-20 Issue: Volume: Page:412-417
ISSN:
Container-title:2023 7th International Conference on Electrical, Mechanical and Computer Engineering (ICEMCE)
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Author:

Zhang Xiaolong¹,Zheng Lin¹,Tian Heng²,Liu Li³,Ma Qun²,Wang Huafeng¹,Gao Chong¹

Affiliation:

1. State Grid Smart Grid Research Institute Co., Ltd.,State Key Laboratory of Advanced Power Transmission Technology,Beijing,China

2. Beijing Kedong Power Control System Co., Ltd.,Beijing,China

3. State Grid Zhoushan power supply company,Zhoushan,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10490442/10490456/10490995.pdf?arnumber=10490995

Reference18 articles.

1. Secular change in characteristics of thyristors used in HVDC valve

2. Nelson River Pole 1 Thyristor Leakage Problem

3. A New Fault Detection Technique for IGBT Based on Gate Voltage Monitoring

4. Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics

5. A Failure-Detection Strategy for IGBT Based on Gate-Voltage Behavior Applied to a Motor Drive System

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