Constrained Coding and Deep Learning Aided Threshold Detection for Resistive Memories-Reference-Cited by-同舟云学术

Constrained Coding and Deep Learning Aided Threshold Detection for Resistive Memories

Author:

Zhong Xingwei¹^ORCID,Cai Kui¹^ORCID,Song Guanghui²^ORCID,Wang Weijie³^ORCID,Zhu Yao³^ORCID

Affiliation:

1. Science, Mathematics and Technology Cluster, Singapore University of Technology and Design, Singapore

2. State Key Laboratory of Integrated Services Networks, Xidian University, Xi’an, China

3. Institute of Microelectronics, Agency for Science, Technology and Research (A*STAR), Singapore

Funder

RIE2020 Advanced Manufacturing and Engineering (AME) programmatic grant

Programmatic

Singapore government’s Research, Innovation and Enterprise 2020 plan (Advanced Manufacturing and Engineering domain) and administered

Agency for Science, Technology and Research

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Modeling and Simulation

Link

Reference10 articles.

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2. Locally Mitigating Sneak-Path Interference in Resistive Memory Arrays;2023 IEEE International Symposium on Information Theory (ISIT);2023-06-25