Total dose failures in advanced electronics from single ions-Reference-Cited by-同舟云学术

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Total dose failures in advanced electronics from single ions

Published:1993-12 Issue:6 Volume:40 Page:1820-1830
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Oldham T.R.,Bennett K.W.,Beaucour J.,Carriere T.,Polvey C.,Garnier P.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx1/23/6769/00273474.pdf?arnumber=273474

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