Sequential Loopback Built-in Self-Test Algorithm for Dual-Polarization Millimeter-Wave Phased-Array Transceivers-Reference-Cited by-同舟云学术

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Sequential Loopback Built-in Self-Test Algorithm for Dual-Polarization Millimeter-Wave Phased-Array Transceivers

Published:2021-06-07 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)
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Author:

Choi Seunguk,Aoki Yuuichi,Park Hyun-Chul,Yang Sung-Gi,Song Ho-Jin

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9489353/9490399/09490480.pdf?arnumber=9490480

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?;IEEE Access;2024

2. Mixer-Free Phase and Amplitude Comparison Method for Built-in Self- Test of Multiple Channel Beamforming IC;2023 IEEE Radio Frequency Integrated Circuits Symposium (RFIC);2023-06-11

3. Fast Simultaneous Distortion Measurement Technique for Mismatch Compensation of Doherty Phased-Array Beamformers;2023 IEEE/MTT-S International Microwave Symposium - IMS 2023;2023-06-11

4. Design of Hybrid Memory Built in Self Test using Linear Feedback Shift Registers;2022 6th International Conference on Electronics, Communication and Aerospace Technology;2022-12-01

5. Implementation of Power Binning-based Logic BIST Control using Activity Factor;2022 International Conference on Augmented Intelligence and Sustainable Systems (ICAISS);2022-11-24

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