Leakage Power Analysis of 25-nm Double-Gate CMOS Devices and Circuits-Reference-Cited by-同舟云学术

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Leakage Power Analysis of 25-nm Double-Gate CMOS Devices and Circuits

Published:2005-05 Issue:5 Volume:52 Page:980-986
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:en
Short-container-title:IEEE Trans. Electron Devices

Author:

Kim K.,Das K.K.,Joshi R.V.,Chuang C.T.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/30755/01424389.pdf?arnumber=1424389

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