A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Education
Link
http://xplorestaging.ieee.org/ielx5/13/5458332/05233773.pdf?arnumber=5233773
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Optical Beam Deflection Based AFM with Integrated Hardware and Software Platform for an Undergraduate Engineering Laboratory;Applied Sciences;2017-02-28
2. Atomic Force Microscopy Education;Science Policy Reports;2016
3. Maximizing Nanotechnology Education at Purdue University: Its Integration into the Electrical Engineering Technology Curriculum;IEEE Nanotechnology Magazine;2013-09
4. MPC of constrained discrete-time linear periodic systems — A framework for asynchronous control: Strong feasibility, stability and optimality via periodic invariance;Automatica;2011-02
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