Unsupervised Defect Segmentation in Selective Laser Melting-Reference-Cited by-同舟云学术

Unsupervised Defect Segmentation in Selective Laser Melting

Published:2023 Issue: Volume:72 Page:1-10
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Wang Ruoxin¹^ORCID,Cheung Chi Fai²^ORCID,Wang Chunjin¹^ORCID

Affiliation:

1. Department of Industrial and Systems Engineering, State Key Laboratory of Ultra-Precision Machining Technology, The Hong Kong Polytechnic University, Kowloon, Hong Kong, China

2. Department of Industrial and Systems Engineering, State Key Laboratory of Ultra-Precision Machining Technology and the Behaviour and Knowledge Engineering Research Centre, The Hong Kong Polytechnic University, Kowloon, Hong Kong, China

Funder

Research Grants Council

Innovation and Technology Commission

Government of the Hong Kong Special Administrative Region, China

Research and Innovation Office of The Hong Kong Polytechnic University

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/10012124/10169004.pdf?arnumber=10169004

Reference48 articles.