Double-Phase Adaptive Neural Network for Condition-Based Monitoring of p-GaN HEMT Under Repetitive Short-Circuit Stresses-Reference-Cited by-同舟云学术

Double-Phase Adaptive Neural Network for Condition-Based Monitoring of p-GaN HEMT Under Repetitive Short-Circuit Stresses

Author:

Mei Wenjuan¹^ORCID,Liu Zhen¹^ORCID,Pan Chaowu²,Li Ouhang³^ORCID,Su Yuanzhang⁴^ORCID,Zhou Qi¹^ORCID

Affiliation:

1. School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China

2. School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China

3. Glasgow College, University of Electronic Science and Technology of China, Chengdu, China

4. School of Automation Engineering and the School of Foreign Languages, University of Electronic Science and Technology of China, Chengdu, China

Funder

National Natural Science Foundation of China

Project of Sichuan Youth Science and Technology Innovation Team, China

Sichuan Science and Technology Program

Basic and Applied Basic Research Foundation of Guangdong Province

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

Reference45 articles.

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