Defect Sample Image Generation Method Based on GANs in Diamond Tool Defect Detection

Author:

Zhao Chenyang1ORCID,Xue Wen1ORCID,Fu Wen-Peng1ORCID,Li Zhang-Qing1ORCID,Fang Xinming1ORCID

Affiliation:

1. School of Mechanical Engineering and Automation, Harbin Institute of Technology (Shenzhen), Shenzhen, China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Reference30 articles.

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5. Attention is all you need;vaswani;Proc Adv Neural Inf Process Syst,2017

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