Deep Learning-Based Binocular Image Analysis for In Situ Measurement of Particle Length Distribution During Crystallization Process-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Deep Learning-Based Binocular Image Analysis for In Situ Measurement of Particle Length Distribution During Crystallization Process

Published:2023 Issue: Volume:72 Page:1-14
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Fan Ji¹^ORCID,Liu Tao¹^ORCID,Shuang Yongcan¹^ORCID,Song Bo¹^ORCID,Chen Junghui²^ORCID,Tan Yonghong³^ORCID

Affiliation:

1. Institute of Advanced Control Technology, Dalian University of Technology, Dalian, China

2. Department of Chemical Engineering, Chung Yuan Christian University, Taoyuan, Taiwan

3. College of Information, Mechanical and Electrical Engineering, Shanghai Normal University, Shanghai, China

Funder

NSF China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/10012124/10309855.pdf?arnumber=10309855

Reference37 articles.

1. Image analysis framework with focus evaluation for in situ characterisation of particle size and shape attributes

2. The Pascal Visual Object Classes (VOC) Challenge

3. Design and optimization of production parameters for boric acid crystals with the crystallization process in an MSMPR crystallizer using FBRM® and PVM® technologies

4. Image segmentation using deep learning: A survey;minaee;IEEE Trans Pattern Anal Mach Intell,2022

5. Bulk video imaging based multivariate image analysis, process control chart and acoustic signal assisted nucleation detection

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP