An Incremental Knowledge Learning Framework for Continuous Defect Detection-Reference-Cited by-同舟云学术

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An Incremental Knowledge Learning Framework for Continuous Defect Detection

Published:2024 Issue: Volume:73 Page:1-11
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Sun Chen¹^ORCID,Gao Liang¹^ORCID,Li Xinyu¹^ORCID,Zheng Pai²^ORCID,Gao Yiping¹^ORCID

Affiliation:

1. State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China

2. Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hong Kong, China

Funder

National Natural Science Foundation of China

Key Research and Development Program of Hubei Province

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/10367905/10363216.pdf?arnumber=10363216

Reference43 articles.

1. Logit Inducing With Abnormality Capturing for Semi-Supervised Image Anomaly Detection

2. A New Contrastive GAN With Data Augmentation for Surface Defect Recognition Under Limited Data

3. PCBNet: A Lightweight Convolutional Neural Network for Defect Inspection in Surface Mount Technology

4. Automated Visual Defect Detection for Flat Steel Surface: A Survey

5. A Lifelong Learning Method for Gearbox Diagnosis With Incremental Fault Types

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